Research Progress on Surface Property Testing Methods for Mineral Flotation
王佳丽王介良时景阳吴旭曹钊
WANG Jiali;WANG Jieliang;SHI Jingyang;WU Xu;CAO Zhao
内蒙古科技大学 矿业与煤炭学院内蒙古矿业工程重点实验室轻稀土资源绿色提取与高效利用教育部重点实验室
浮选是一种根据物料表面物理化学性质(主要指润湿性)的差异在气、液、固三相流中对物料进行分离和提纯的技术,常用于矿物的分选。对矿物基本浮选行为、表面电性、吸附及溶液化学行为等的研究,是确定浮选药剂与矿物表面相互作用机理的基本方法,但对许多复杂浮选体系,更需要各种现代测试方法去表征或证明这些作用机理,更清楚地从微观层面揭示浮选药剂与矿物表面相互作用的本质。综合分析了成像分析技术如原子力显微镜(AFM)、透射电子显微镜(TEM)、扫描电子显微镜(SEM) 和表面成分分析技术如Zeta电位、红外光谱、拉曼光谱、X射线光电子能谱(XPS)、飞行时间二次离子质谱(TOF−SIMS) 等测试方法在浮选中的应用和研究现状,为今后浮选界面测试发展提供参考。
Flotation is a technology that separates and purifies materials in a three−phase flow of gas, liquid, and solid based on the differences in physical and chemical properties (mainly referring to wettability) of the material surface. It is widely used for mineral separation. Studying the basic flotation behavior, wettability, surface electrical properties, adsorption, and solution chemistry of minerals is a fundamental method for determining the interaction mechanism between flotation agents and mineral surfaces. However, for many complex flotation systems, various modern testing methods are required to characterize or prove these interaction mechanisms, and to reveal the essence of the interaction between flotation agents and mineral surfaces more clearly at the microscopic level. This article comprehensively analyzes the application and research status of imaging analysis techniques such as atomic force microscopy (AFM), transmission electron microscopy (TEM), scanning electron microscopy (SEM), and surface composition analysis techniques such as Zeta potential, infrared spectroscopy, Raman spectroscopy, X−ray photoelectron spectroscopy (XPS), time of flight secondary ion mass spectrometry (TOF−SIMS) in flotation, providing reference for the better development of flotation interface testing in the future.
浮选测试技术成像分析表面成分分析
flotation;test technology;imaging analysis;surface composition analysis
主办单位:煤炭科学研究总院有限公司 中国煤炭学会学术期刊工作委员会